Optical edge-projection method for three dimensional profilometry

• Main Authors: Tay, Cho Jui, Miao, Hong, Fu, Yu
• Other Authors: Temasek Laboratories
• Format: Article
• Language: English
• Published: 2010
• Subjects: DRNTU::Science::Physics::Optics and light
• Online Access: https://hdl.handle.net/10356/92034; http://hdl.handle.net/10220/6471
• Institution: Nanyang Technological University

A novel optical edge-projection method is proposed for surface contouring of an object with low reflectivity. A structured light edge is projected onto a dark surface, and the image is captured by a CCD camera. The object contour is evaluated with an active triangular projection algorithm, and one obtains a whole-field three-dimensional contour of the object by scanning the optical edge over the entire object surface. The proposed method is applied to a black nonreflective object made from woven carbon fiber and is also applied to measure the profile of a small object (a coin). The results show that an accurate profile of the specimen can be obtained.