Analysis of phase distortion in phase-shifted fringe projection

• Main Authors: Miao, Hong, Quan, Chenggen, Tay, Cho Jui, Fu, Yu
• Other Authors: Temasek Laboratories
• Format: Article
• Language: English
• Published: 2010
• Subjects: DRNTU::Science::Physics::Optics and light
• Online Access: https://hdl.handle.net/10356/92124; http://hdl.handle.net/10220/6488
• Institution: Nanyang Technological University

This paper describes the analysis of phase distortion in phase-shifted fringe projection method. A phase distortion occurs when the phase shifting technique is applied to extract the phase values from projected fringe patterns in surface contouring. The phase distortion will induce measurement errors especially in the measurement of micro-components. The cause of such phase distortion is investigated and the influence of phase distortion on the measurement of micro-components is discussed. To eliminate the phase distortion, a continuous wavelet transform (CWT) is employed to extract phase values from object surface modulated fringe patterns. Principle of the proposed CWT phase extraction method is described and experiments are conducted to verify the proposed method. It is shown that by the use of CWT phase extraction method phase distortion induced in conventional phase-shifting technique can be completely eliminated.