Valence-electron distribution in MgB2 by accurate diffraction measurements and first-principles calculations
We use synchrotron x-ray and precision electron-diffraction techniques to determine accurately the structure factors of reflections that are sensitive to the valence-electron distribution in the superconductor MgB2 . These values deviate significantly from those calculated using the scattering facto...
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Main Authors: | , , , , , |
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格式: | Article |
語言: | English |
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2011
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在線閱讀: | https://hdl.handle.net/10356/92217 http://hdl.handle.net/10220/6933 |
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機構: | Nanyang Technological University |
語言: | English |