Valence-electron distribution in MgB2 by accurate diffraction measurements and first-principles calculations

We use synchrotron x-ray and precision electron-diffraction techniques to determine accurately the structure factors of reflections that are sensitive to the valence-electron distribution in the superconductor MgB2 . These values deviate significantly from those calculated using the scattering facto...

全面介紹

Saved in:
書目詳細資料
Main Authors: Wu, Lijun, Zhu, Yimei, Su, Haibin, Vogt, T., Tafto, J., Davenport, James W.
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2011
主題:
在線閱讀:https://hdl.handle.net/10356/92217
http://hdl.handle.net/10220/6933
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
機構: Nanyang Technological University
語言: English