Soft X-Ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite

• المؤلفون الرئيسيون: Li, Qiang, Zhu, Yimei, Su, Haibin, Fischer, D. A., Moodenbaugh, A. R., Gu, G. D., Welch, David O., Davenport, James W.
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2011
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/92669; http://hdl.handle.net/10220/6878

Soft X-ray absorption spectroscopy (XAS), using uorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.