Kim, T. T., Persaud, R., Kim, C. H., & Engineering, S. o. E. a. E. (2010). Silicon odometer: An on-chip reliability monitor for measuring frequency degradation of digital circuits.
Chicago Style CitationKim, Tony Tae-Hyoung, Randy Persaud, Chris H. Kim, and School of Electrical and Electronic Engineering. Silicon Odometer: An On-chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits. 2010.
MLA引文Kim, Tony Tae-Hyoung, Randy Persaud, Chris H. Kim, and School of Electrical and Electronic Engineering. Silicon Odometer: An On-chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits. 2010.
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