Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits

• Main Authors: Kim, Tony Tae-Hyoung, Persaud, Randy., Kim, Chris H.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2010
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• Online Access: https://hdl.handle.net/10356/93518; http://hdl.handle.net/10220/6327
• Institution: Nanyang Technological University

Precise measurement of digital circuit degradation is a key aspect of aging tolerant digital circuit design. In this study, we present a fully digital on-chip reliability monitor for high-resolution frequency degradation measurements of digital circuits. The proposed technique measures the beat freq...