Charge transfer dynamics in Cu-doped ZnO nanowires

Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps, between the ZnO host and the Cu dopants in Cu-doped...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Xing, Guozhong, Xing, Guichuan, Li, Mingjie, Sie, Edbert Jarvis, Wang, Dandan, Sulistio, Arief, Ye, Quan Lin, Huan, Alfred Cheng Hon, Wu, Tom, Sum, Tze Chien
مؤلفون آخرون: School of Physical and Mathematical Sciences
التنسيق: مقال
اللغة:English
منشور في: 2011
الموضوعات:
الوصول للمادة أونلاين:https://hdl.handle.net/10356/93831
http://hdl.handle.net/10220/6911
الوسوم: إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
الوصف
الملخص:Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.