Charge transfer dynamics in Cu-doped ZnO nanowires
Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps, between the ZnO host and the Cu dopants in Cu-doped...
Saved in:
| Main Authors: | , , , , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2011
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/93831 http://hdl.handle.net/10220/6911 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Nanyang Technological University |
| Language: | English |
| id |
sg-ntu-dr.10356-93831 |
|---|---|
| record_format |
dspace |
| spelling |
sg-ntu-dr.10356-938312023-02-28T19:33:19Z Charge transfer dynamics in Cu-doped ZnO nanowires Xing, Guozhong Xing, Guichuan Li, Mingjie Sie, Edbert Jarvis Wang, Dandan Sulistio, Arief Ye, Quan Lin Huan, Alfred Cheng Hon Wu, Tom Sum, Tze Chien School of Physical and Mathematical Sciences DRNTU::Science::Chemistry::Physical chemistry Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes. Published version 2011-07-18T06:22:47Z 2019-12-06T18:46:18Z 2011-07-18T06:22:47Z 2019-12-06T18:46:18Z 2011 2011 Journal Article Xing, G., Xing, G., Li, M., Sie, E. J., Wang, D., Sulistio, A., et al. (2011). Charge transfer dynamics in Cu-doped ZnO nanowires. Applied Physics Letters, 98. 0003-6951 https://hdl.handle.net/10356/93831 http://hdl.handle.net/10220/6911 10.1063/1.3558912 157527 en Applied physics letters © 2011 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.3558912. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 3 p. application/pdf |
| institution |
Nanyang Technological University |
| building |
NTU Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NTU Library |
| collection |
DR-NTU |
| language |
English |
| topic |
DRNTU::Science::Chemistry::Physical chemistry |
| spellingShingle |
DRNTU::Science::Chemistry::Physical chemistry Xing, Guozhong Xing, Guichuan Li, Mingjie Sie, Edbert Jarvis Wang, Dandan Sulistio, Arief Ye, Quan Lin Huan, Alfred Cheng Hon Wu, Tom Sum, Tze Chien Charge transfer dynamics in Cu-doped ZnO nanowires |
| description |
Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an
ultrafast charge transfer (CT) process, with an electron localization time constant 39+-9 ps,
between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively
competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission.
TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related
green emission. TA measurements probing the state-filling of the band edge and defect states
provide further support to the CT model where the bleaching dynamics concur with the TRPL
lifetimes. |
| author2 |
School of Physical and Mathematical Sciences |
| author_facet |
School of Physical and Mathematical Sciences Xing, Guozhong Xing, Guichuan Li, Mingjie Sie, Edbert Jarvis Wang, Dandan Sulistio, Arief Ye, Quan Lin Huan, Alfred Cheng Hon Wu, Tom Sum, Tze Chien |
| format |
Article |
| author |
Xing, Guozhong Xing, Guichuan Li, Mingjie Sie, Edbert Jarvis Wang, Dandan Sulistio, Arief Ye, Quan Lin Huan, Alfred Cheng Hon Wu, Tom Sum, Tze Chien |
| author_sort |
Xing, Guozhong |
| title |
Charge transfer dynamics in Cu-doped ZnO nanowires |
| title_short |
Charge transfer dynamics in Cu-doped ZnO nanowires |
| title_full |
Charge transfer dynamics in Cu-doped ZnO nanowires |
| title_fullStr |
Charge transfer dynamics in Cu-doped ZnO nanowires |
| title_full_unstemmed |
Charge transfer dynamics in Cu-doped ZnO nanowires |
| title_sort |
charge transfer dynamics in cu-doped zno nanowires |
| publishDate |
2011 |
| url |
https://hdl.handle.net/10356/93831 http://hdl.handle.net/10220/6911 |
| _version_ |
1759854343885946880 |