A new characterization approach of weld nugget growth by real-time input electrical impedance
The in-process changes of weld nugget growth during the Resistance Spot Welding were investigated based on the resistance of input electrical impedance. To compute the time varying resistance of input electrical impedance, the welding voltage and current signals are measured simultaneously and then...
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sg-ntu-dr.10356-939922023-03-04T17:17:53Z A new characterization approach of weld nugget growth by real-time input electrical impedance Wong, Yoke-Rung Pang, Xin School of Mechanical and Aerospace Engineering DRNTU::Engineering::Mechanical engineering::Assistive technology The in-process changes of weld nugget growth during the Resistance Spot Welding were investigated based on the resistance of input electrical impedance. To compute the time varying resistance of input electrical impedance, the welding voltage and current signals are measured simultaneously and then converted into complex-valued signals by using Hilbert transform. Comparing with the dynamic contact resistance as reported in literature, it showed that the time varying resistance of input electrical impedance can be accurately correlated with the physical changes of weld nugget growth. Therefore, it can be used to characterize the in-process changes of weld nugget growth. Several new findings were reported based on the investigation of spot welds under no weld, with and without weld expulsion conditions. Published version 2015-05-18T08:22:09Z 2019-12-06T18:48:50Z 2015-05-18T08:22:09Z 2019-12-06T18:48:50Z 2014 2014 Journal Article Wong, Y.-R., & Pang, X. (2014). A new characterization approach of weld nugget growth by real-time input electrical impedance. Engineering, 6(9), 516-525. https://hdl.handle.net/10356/93992 http://hdl.handle.net/10220/25589 http://www.scirp.org/journal/PaperInformation.aspx?PaperID=48564#.VVWW5Lmqqko 186070 en Engineering © 2014 by authors and Scientific Research Publishing Inc. This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/ 11 p. application/pdf |
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DRNTU::Engineering::Mechanical engineering::Assistive technology Wong, Yoke-Rung Pang, Xin A new characterization approach of weld nugget growth by real-time input electrical impedance |
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The in-process changes of weld nugget growth during the Resistance Spot Welding were investigated based on the resistance of input electrical impedance. To compute the time varying resistance of input electrical impedance, the welding voltage and current signals are measured simultaneously and then converted into complex-valued signals by using Hilbert transform. Comparing with the dynamic contact resistance as reported in literature, it showed that the time varying resistance of input electrical impedance can be accurately correlated with the physical changes of weld nugget growth. Therefore, it can be used to characterize the in-process changes of weld nugget growth. Several new findings were reported based on the investigation of spot welds under no weld, with and without weld expulsion conditions. |
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School of Mechanical and Aerospace Engineering |
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School of Mechanical and Aerospace Engineering Wong, Yoke-Rung Pang, Xin |
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Article |
author |
Wong, Yoke-Rung Pang, Xin |
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Wong, Yoke-Rung |
title |
A new characterization approach of weld nugget growth by real-time input electrical impedance |
title_short |
A new characterization approach of weld nugget growth by real-time input electrical impedance |
title_full |
A new characterization approach of weld nugget growth by real-time input electrical impedance |
title_fullStr |
A new characterization approach of weld nugget growth by real-time input electrical impedance |
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A new characterization approach of weld nugget growth by real-time input electrical impedance |
title_sort |
new characterization approach of weld nugget growth by real-time input electrical impedance |
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2015 |
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https://hdl.handle.net/10356/93992 http://hdl.handle.net/10220/25589 http://www.scirp.org/journal/PaperInformation.aspx?PaperID=48564#.VVWW5Lmqqko |
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