An analytical method to study the effects of a substrate in surface-enhanced Raman scattering
In studies of surface-enhanced Raman scattering (SERS), individual metal nanoparticle and particle assemblies introduce enhancement of electromagnetic fields. However, the contributions to enhancement due to the substrate supporting the particles are yet to be studied analytically. In this communica...
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sg-ntu-dr.10356-951362023-02-28T19:24:31Z An analytical method to study the effects of a substrate in surface-enhanced Raman scattering Huang, Shao Ying Wu, Bae-Ian Zhang, Baile Lee, Yee Hui Liberman, Vladimir Rothschild, Mordechai School of Physical and Mathematical Sciences DRNTU::Science::Mathematics::Number theory In studies of surface-enhanced Raman scattering (SERS), individual metal nanoparticle and particle assemblies introduce enhancement of electromagnetic fields. However, the contributions to enhancement due to the substrate supporting the particles are yet to be studied analytically. In this communication, we present an analytical method to investigate the effect of a substrate with realistic layers in SERS. The proposed method quantifies the effect of a substrate on the electric field on the nanoparticles surface in SERS experiments. By applying the proposed method, optimal constructions of a substrate can be obtained to maximize the surface electric field while a poorly constructed one can be avoided. The maximization can lead to a high Raman enhancement factor. The method is verified using numerical simulations. Published version 2012-10-29T00:50:51Z 2019-12-06T19:08:58Z 2012-10-29T00:50:51Z 2019-12-06T19:08:58Z 2009 2009 Journal Article Huang, S. Y., Wu, B. I., Zhang, B., Lee, Y. H., Liberman, V., & Rothschild, M. (2009). An analytical method to study the effects of a substrate in surface-enhanced Raman scattering. Journal of Applied Physics, 106(11). 00218979 https://hdl.handle.net/10356/95136 http://hdl.handle.net/10220/8804 10.1063/1.3264635 en Journal of applied physics © 2009 American Institute of Physics. This paper was published in Journal of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: http://dx.doi.org/10.1063/1.3264635. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf |
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DRNTU::Science::Mathematics::Number theory Huang, Shao Ying Wu, Bae-Ian Zhang, Baile Lee, Yee Hui Liberman, Vladimir Rothschild, Mordechai An analytical method to study the effects of a substrate in surface-enhanced Raman scattering |
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In studies of surface-enhanced Raman scattering (SERS), individual metal nanoparticle and particle assemblies introduce enhancement of electromagnetic fields. However, the contributions to enhancement due to the substrate supporting the particles are yet to be studied analytically. In this communication, we present an analytical method to investigate the effect of a substrate with realistic layers in SERS. The proposed method quantifies the effect of a substrate on the electric field on the nanoparticles surface in SERS experiments. By applying the proposed method, optimal constructions of a substrate can be obtained to maximize the surface electric field while a poorly constructed one can be avoided. The maximization can lead to a high Raman enhancement factor. The method is verified using numerical simulations. |
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School of Physical and Mathematical Sciences |
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School of Physical and Mathematical Sciences Huang, Shao Ying Wu, Bae-Ian Zhang, Baile Lee, Yee Hui Liberman, Vladimir Rothschild, Mordechai |
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Article |
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Huang, Shao Ying Wu, Bae-Ian Zhang, Baile Lee, Yee Hui Liberman, Vladimir Rothschild, Mordechai |
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Huang, Shao Ying |
title |
An analytical method to study the effects of a substrate in surface-enhanced Raman scattering |
title_short |
An analytical method to study the effects of a substrate in surface-enhanced Raman scattering |
title_full |
An analytical method to study the effects of a substrate in surface-enhanced Raman scattering |
title_fullStr |
An analytical method to study the effects of a substrate in surface-enhanced Raman scattering |
title_full_unstemmed |
An analytical method to study the effects of a substrate in surface-enhanced Raman scattering |
title_sort |
analytical method to study the effects of a substrate in surface-enhanced raman scattering |
publishDate |
2012 |
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https://hdl.handle.net/10356/95136 http://hdl.handle.net/10220/8804 |
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1759855973277630464 |