Demonstration of high-resolution capability of chemical force titration via study of acid/base properties of a patterned self-assembled monolayer

• Main Authors: He, Hui-Xin, Huang, Wei, Zhang, Hua, Li, Qi Guang, Li, Sam Fong Yau, Liu, Zhong-Fan
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2012
• Subjects: DRNTU::Engineering::Materials
• Online Access: https://hdl.handle.net/10356/95398; http://hdl.handle.net/10220/8629
• Institution: Nanyang Technological University

An experimental approach for probing the resolution of chemical force titration is reported here. A self-assembled monolayer (SAM) patterned with COOH and CH3 groups was used as the model surface, and its local dissociation property was studied by both chemical force titration and contact angle titr...