Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers

• Main Authors: Zhang, Hua, Müllen, Klaus, De Feyter, Steven
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2012
• Subjects: DRNTU::Engineering::Materials
• Online Access: https://hdl.handle.net/10356/95586; http://hdl.handle.net/10220/8605
• Institution: Nanyang Technological University

Pulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-a...