Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers

• Main Authors: Zhang, Hua, Müllen, Klaus, De Feyter, Steven
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2012
• 主題: DRNTU::Engineering::Materials
• 在線閱讀: https://hdl.handle.net/10356/95586; http://hdl.handle.net/10220/8605

Pulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-a...