Force titration of amino group-terminated self-assembled monolayers using chemical force microscopy

Chemical force microscopy (CFM) was used to measure the adhesion force between an Au-coated Si3N4 tip functionalized with OH groups and a silicon substrate functionalized with NH2 groups. The curve of the adhesion force as a function of the solution pH value (force titration curve) was obtained. The...

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Bibliographic Details
Main Authors: Zhang, Hua, He, Hui-Xin, Wang, J., Mu, Tao, Liu, Zhong-Fan
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/95685
http://hdl.handle.net/10220/8325
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Institution: Nanyang Technological University
Language: English
Description
Summary:Chemical force microscopy (CFM) was used to measure the adhesion force between an Au-coated Si3N4 tip functionalized with OH groups and a silicon substrate functionalized with NH2 groups. The curve of the adhesion force as a function of the solution pH value (force titration curve) was obtained. The pK1=2 of surface NH2 groups estimated from the force titration curve is 7:4, about 3 pK units lower than the pK value of NH2 functionality in aqueous solution, and in nice agreement with the value of pK1=2 D 7:6 determined by conventional contact angle titration. The surface pK1=2 value that we obtained from the force titration or contact angle titration is the apparent surface pK value, which is expressed as the corresponding bulk solution pH value at which the functional groups at the interface are half-ionized.