Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes

Epitaxial strain plays an important role in determining physical properties of perovskite ferroelectric oxide thin films because of the inherent coupling between the strain and the polarization. However, it is very challenging to directly measure properties such as polarization in ultrathin strained...

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Main Authors: You, Lu, Chen, Zuhuang, Zou, Xi, Ren, Wei, Huang, Chuanwei, Yang, Yurong, Yang, Ping, Wang, Junling, Sritharan, Thirumany, Chen, Lang, Bellaiche, L.
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/96331
http://hdl.handle.net/10220/10230
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-963312020-06-01T10:26:32Z Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes You, Lu Chen, Zuhuang Zou, Xi Ren, Wei Huang, Chuanwei Yang, Yurong Yang, Ping Wang, Junling Sritharan, Thirumany Chen, Lang Bellaiche, L. School of Materials Science & Engineering Epitaxial strain plays an important role in determining physical properties of perovskite ferroelectric oxide thin films because of the inherent coupling between the strain and the polarization. However, it is very challenging to directly measure properties such as polarization in ultrathin strained films, using traditional sandwich capacitor devices, because of high leakage current. Hence, a planar electrode device with different crystallographical orientations between electrodes, which is able to measure the polarization response with different electric field orientation, is used successfully in this work to directly measure the in-plane polarization–electric-field (P-E) hysteresis loops in fully strained thin films. We used BiFeO3 (BFO) as a model system and measured in-plane P-E loops not only in the rhombohedral-like (R-like) BFO thin films but also in largely strained BFO films exhibiting the pure tetragonal-like (T-like) phase. The exact magnitude and direction of the spontaneous polarization vector of the T-like phase is deduced thanks to the collection of in-plane polarization components along different orientations. It is also shown that the polarization vector in the R-like phase of BiFeO3 is constrained to lie within the (11̅ 0) plane and rotates from the [111] towards the [001] pseudocubic direction when the compressive strain is increased from zero. At high misfit strains such as −4.4%, the pure T-like phase is obtained and its polarization vector is constrained to lie in the (010) plane with a significantly large in-plane component, ∼44 μC/cm2. First-principles calculations are carried out in parallel, and provide a good agreement with the experimental results. Published version 2013-06-12T03:11:58Z 2019-12-06T19:29:07Z 2013-06-12T03:11:58Z 2019-12-06T19:29:07Z 2012 2012 Journal Article Chen, Z., Zou, X., Ren, W., You, L., Huang, C., Yang, Y., et al. (2012). Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes. Physical Review B, 86(23), 235125-. 1098-0121 https://hdl.handle.net/10356/96331 http://hdl.handle.net/10220/10230 10.1103/PhysRevB.86.235125 en Physical review B © 2012 American Physical Society. This paper was published in Physical Review B and is made available as an electronic reprint (preprint) with permission of American Physical Society. The paper can be found at the following official DOI: [http://dx.doi.org/10.1103/PhysRevB.86.235125].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
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description Epitaxial strain plays an important role in determining physical properties of perovskite ferroelectric oxide thin films because of the inherent coupling between the strain and the polarization. However, it is very challenging to directly measure properties such as polarization in ultrathin strained films, using traditional sandwich capacitor devices, because of high leakage current. Hence, a planar electrode device with different crystallographical orientations between electrodes, which is able to measure the polarization response with different electric field orientation, is used successfully in this work to directly measure the in-plane polarization–electric-field (P-E) hysteresis loops in fully strained thin films. We used BiFeO3 (BFO) as a model system and measured in-plane P-E loops not only in the rhombohedral-like (R-like) BFO thin films but also in largely strained BFO films exhibiting the pure tetragonal-like (T-like) phase. The exact magnitude and direction of the spontaneous polarization vector of the T-like phase is deduced thanks to the collection of in-plane polarization components along different orientations. It is also shown that the polarization vector in the R-like phase of BiFeO3 is constrained to lie within the (11̅ 0) plane and rotates from the [111] towards the [001] pseudocubic direction when the compressive strain is increased from zero. At high misfit strains such as −4.4%, the pure T-like phase is obtained and its polarization vector is constrained to lie in the (010) plane with a significantly large in-plane component, ∼44 μC/cm2. First-principles calculations are carried out in parallel, and provide a good agreement with the experimental results.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
You, Lu
Chen, Zuhuang
Zou, Xi
Ren, Wei
Huang, Chuanwei
Yang, Yurong
Yang, Ping
Wang, Junling
Sritharan, Thirumany
Chen, Lang
Bellaiche, L.
format Article
author You, Lu
Chen, Zuhuang
Zou, Xi
Ren, Wei
Huang, Chuanwei
Yang, Yurong
Yang, Ping
Wang, Junling
Sritharan, Thirumany
Chen, Lang
Bellaiche, L.
spellingShingle You, Lu
Chen, Zuhuang
Zou, Xi
Ren, Wei
Huang, Chuanwei
Yang, Yurong
Yang, Ping
Wang, Junling
Sritharan, Thirumany
Chen, Lang
Bellaiche, L.
Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes
author_sort You, Lu
title Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes
title_short Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes
title_full Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes
title_fullStr Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes
title_full_unstemmed Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes
title_sort study of strain effect on in-plane polarization in epitaxial bifeo3 thin films using planar electrodes
publishDate 2013
url https://hdl.handle.net/10356/96331
http://hdl.handle.net/10220/10230
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