Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes

• Main Authors: You, Lu, Chen, Zuhuang, Zou, Xi, Ren, Wei, Huang, Chuanwei, Yang, Yurong, Yang, Ping, Wang, Junling, Sritharan, Thirumany, Chen, Lang, Bellaiche, L.
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2013
• 在線閱讀: https://hdl.handle.net/10356/96331; http://hdl.handle.net/10220/10230
• 機構: Nanyang Technological University

Epitaxial strain plays an important role in determining physical properties of perovskite ferroelectric oxide thin films because of the inherent coupling between the strain and the polarization. However, it is very challenging to directly measure properties such as polarization in ultrathin strained...