Study of strain effect on in-plane polarization in epitaxial BiFeO3 thin films using planar electrodes

• المؤلفون الرئيسيون: You, Lu, Chen, Zuhuang, Zou, Xi, Ren, Wei, Huang, Chuanwei, Yang, Yurong, Yang, Ping, Wang, Junling, Sritharan, Thirumany, Chen, Lang, Bellaiche, L.
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/96331; http://hdl.handle.net/10220/10230

Epitaxial strain plays an important role in determining physical properties of perovskite ferroelectric oxide thin films because of the inherent coupling between the strain and the polarization. However, it is very challenging to directly measure properties such as polarization in ultrathin strained...