Agrawal, M., Radhakrishnan, K., Dharmarasu, N., Ravikiran, L., & Engineering, S. o. E. a. E. (2013). Structural properties of GaN grown on AlGaN/AlN stress mitigating layers on 100-mm Si (111) by ammonia molecular beam epitaxy.
استشهاد بنمط شيكاغوAgrawal, M., K. Radhakrishnan, Nethaji Dharmarasu, Lingaparthi Ravikiran, و School of Electrical and Electronic Engineering. Structural Properties of GaN Grown On AlGaN/AlN Stress Mitigating Layers On 100-mm Si (111) By Ammonia Molecular Beam Epitaxy. 2013.
MLA استشهادAgrawal, M., et al. Structural Properties of GaN Grown On AlGaN/AlN Stress Mitigating Layers On 100-mm Si (111) By Ammonia Molecular Beam Epitaxy. 2013.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.