An analytical formulation for the fatigue damage skewness relating to a narrowband process

• Main Author: Low, Ying Min.
• Other Authors: School of Civil and Environmental Engineering
• Format: Article
• Language: English
• Published: 2013
• Online Access: https://hdl.handle.net/10356/96554; http://hdl.handle.net/10220/10310
• Institution: Nanyang Technological University

In spectral fatigue analysis, the expected fatigue damage is customarily used to ascertain the design fatigue life. The uncertainty of the damage induced by the underlying stochastic process is typically disregarded in both theory and practice. Yet, this uncertainty may be consequential in many circ...