APA引文

Ong, S. N., Yeo, K. S., Chew, K. W. J., Chan, L. H. K., Loo, X. S., Boon, C. C., . . . Engineering, S. o. E. a. E. (2013). A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS.

Chicago Style Citation

Ong, Shih Ni, Kiat Seng Yeo, Kok Wai Johnny Chew, L. H. K. Chan, Xi Sung Loo, Chirn Chye Boon, Manh Anh Do, and School of Electrical and Electronic Engineering. A New Field Dependent Mobility Model for High Frequency Channel Thermal Noise of Deep Submicron RFCMOS. 2013.

MLA引文

Ong, Shih Ni, et al. A New Field Dependent Mobility Model for High Frequency Channel Thermal Noise of Deep Submicron RFCMOS. 2013.