Credit risk evaluation with extreme learning machine

Credit risk evaluation has become an increasingly important field in financial risk management for financial institutions, especially for banks and credit card companies. Many data mining and statistical methods have been applied to this field. Extreme learning machine (ELM) classifier as a type of...

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Main Authors: Zhou, Hongming, Lan, Yuan, Soh, Yeng Chai, Huang, Guang-Bin, Zhang, Rui
Other Authors: School of Electrical and Electronic Engineering
Format: Conference or Workshop Item
Language:English
Published: 2013
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Online Access:https://hdl.handle.net/10356/97364
http://hdl.handle.net/10220/13161
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-973642020-03-07T13:24:47Z Credit risk evaluation with extreme learning machine Zhou, Hongming Lan, Yuan Soh, Yeng Chai Huang, Guang-Bin Zhang, Rui School of Electrical and Electronic Engineering IEEE International Conference on Systems, Man and Cybernetics (2012 : Seoul, Korea) DRNTU::Engineering::Electrical and electronic engineering Credit risk evaluation has become an increasingly important field in financial risk management for financial institutions, especially for banks and credit card companies. Many data mining and statistical methods have been applied to this field. Extreme learning machine (ELM) classifier as a type of generalized single hidden layer feed-forward networks has been used in many applications and achieve good classification accuracy. Thus, we use ELM (kernel based) as a classification tool to perform the credit risk evaluation in this paper. The simulations are done on two credit risk evaluation datasets with three different kernel functions. Simulation results show that the kernel based ELM is more suitable for credit risk evaluation than the popular used Support Vector Machines (SVMs) with consideration of overall, good and bad accuracies. 2013-08-16T04:11:50Z 2019-12-06T19:41:53Z 2013-08-16T04:11:50Z 2019-12-06T19:41:53Z 2012 2012 Conference Paper https://hdl.handle.net/10356/97364 http://hdl.handle.net/10220/13161 10.1109/ICSMC.2012.6377871 en
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Zhou, Hongming
Lan, Yuan
Soh, Yeng Chai
Huang, Guang-Bin
Zhang, Rui
Credit risk evaluation with extreme learning machine
description Credit risk evaluation has become an increasingly important field in financial risk management for financial institutions, especially for banks and credit card companies. Many data mining and statistical methods have been applied to this field. Extreme learning machine (ELM) classifier as a type of generalized single hidden layer feed-forward networks has been used in many applications and achieve good classification accuracy. Thus, we use ELM (kernel based) as a classification tool to perform the credit risk evaluation in this paper. The simulations are done on two credit risk evaluation datasets with three different kernel functions. Simulation results show that the kernel based ELM is more suitable for credit risk evaluation than the popular used Support Vector Machines (SVMs) with consideration of overall, good and bad accuracies.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Zhou, Hongming
Lan, Yuan
Soh, Yeng Chai
Huang, Guang-Bin
Zhang, Rui
format Conference or Workshop Item
author Zhou, Hongming
Lan, Yuan
Soh, Yeng Chai
Huang, Guang-Bin
Zhang, Rui
author_sort Zhou, Hongming
title Credit risk evaluation with extreme learning machine
title_short Credit risk evaluation with extreme learning machine
title_full Credit risk evaluation with extreme learning machine
title_fullStr Credit risk evaluation with extreme learning machine
title_full_unstemmed Credit risk evaluation with extreme learning machine
title_sort credit risk evaluation with extreme learning machine
publishDate 2013
url https://hdl.handle.net/10356/97364
http://hdl.handle.net/10220/13161
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