Development of near-field emission limit from radiated-emission limit based on statistical approach

• Main Authors: See, Kye Yak, Fang, Ning, Wang, Lin Biao, Soh, Wei-Shan, Svimonishvili, Tengiz, Oswal, Manish, Chang, Weng-Yew, Koh, Wee Jin
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/97437; http://hdl.handle.net/10220/12006
• Institution: Nanyang Technological University

This paper discusses a novel approach to transforming a radiated-emission limit (e.g., CISPR 22 and FCC) from the far-field to the near-field region. The proposed approach combines data from a near-field scanner and a gigahertz transverse electromagnetic cell with statistics to establish a simple relationship between a near-field magnetic field and a far-field electric field. It is shown that the proposed approach has the potential to be a simple, quick, and fairly inexpensive tool for electromagnetic compatibility pre-compliance purposes.