Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film

(100)-oriented PLZT ((Pb1-x, Lax) (Zry,Ti1-y)1-x/4O3, x/y=9/65) films of up to ~ 1.23 μm have been developed on LaAlO3 single crystal substrate by magnetron sputtering. The as-grown PLZT thin films exhibit high optical transparency in visible and near-infrared light wavelength and high quadratic (Ke...

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Main Authors: Zhu, Min Min, Du, Ze Hui, Ma, Jan
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/97648
http://hdl.handle.net/10220/13179
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-976482020-06-01T10:01:55Z Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film Zhu, Min Min Du, Ze Hui Ma, Jan School of Materials Science & Engineering Temasek Laboratories (100)-oriented PLZT ((Pb1-x, Lax) (Zry,Ti1-y)1-x/4O3, x/y=9/65) films of up to ~ 1.23 μm have been developed on LaAlO3 single crystal substrate by magnetron sputtering. The as-grown PLZT thin films exhibit high optical transparency in visible and near-infrared light wavelength and high quadratic (Kerr) EO coefficients. Prism coupler measurements reveal that the PLZT thin films possess large refractive index, as high as 2.524 in TE model and 2.481 in TM model. The transparency of >70% in the range of λ= 500-1200 nm, the optic band gap of 3.42 eV and the quadratic electro-optic (EO) coefficient of 3.38 x 10-17 (m/V)2 have been measured in the films. Due to the large EO coefficient and the micrometric thickness, the as-developed PLZT films have great potential in developing longitudinal-or transverse-type EO devices in electric and optic field. 2013-08-22T04:23:51Z 2019-12-06T19:44:55Z 2013-08-22T04:23:51Z 2019-12-06T19:44:55Z 2012 2012 Journal Article Zhu, M. M., Du, Z. H.,& Ma, J. (2012). Electro-Optic Properties of (100)-Oriented (Pb,La(Zr,Ti)O<sub>3 </sub>Thin Film. Solid State Phenomena, 60-64. https://hdl.handle.net/10356/97648 http://hdl.handle.net/10220/13179 10.4028/www.scientific.net/SSP.185.60 en Solid state phenomena
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
description (100)-oriented PLZT ((Pb1-x, Lax) (Zry,Ti1-y)1-x/4O3, x/y=9/65) films of up to ~ 1.23 μm have been developed on LaAlO3 single crystal substrate by magnetron sputtering. The as-grown PLZT thin films exhibit high optical transparency in visible and near-infrared light wavelength and high quadratic (Kerr) EO coefficients. Prism coupler measurements reveal that the PLZT thin films possess large refractive index, as high as 2.524 in TE model and 2.481 in TM model. The transparency of >70% in the range of λ= 500-1200 nm, the optic band gap of 3.42 eV and the quadratic electro-optic (EO) coefficient of 3.38 x 10-17 (m/V)2 have been measured in the films. Due to the large EO coefficient and the micrometric thickness, the as-developed PLZT films have great potential in developing longitudinal-or transverse-type EO devices in electric and optic field.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Zhu, Min Min
Du, Ze Hui
Ma, Jan
format Article
author Zhu, Min Min
Du, Ze Hui
Ma, Jan
spellingShingle Zhu, Min Min
Du, Ze Hui
Ma, Jan
Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
author_sort Zhu, Min Min
title Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
title_short Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
title_full Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
title_fullStr Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
title_full_unstemmed Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
title_sort electro-optic properties of (100)-oriented (pb,la(zr,ti)o3 thin film
publishDate 2013
url https://hdl.handle.net/10356/97648
http://hdl.handle.net/10220/13179
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