Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film
(100)-oriented PLZT ((Pb1-x, Lax) (Zry,Ti1-y)1-x/4O3, x/y=9/65) films of up to ~ 1.23 μm have been developed on LaAlO3 single crystal substrate by magnetron sputtering. The as-grown PLZT thin films exhibit high optical transparency in visible and near-infrared light wavelength and high quadratic (Ke...
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sg-ntu-dr.10356-976482020-06-01T10:01:55Z Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film Zhu, Min Min Du, Ze Hui Ma, Jan School of Materials Science & Engineering Temasek Laboratories (100)-oriented PLZT ((Pb1-x, Lax) (Zry,Ti1-y)1-x/4O3, x/y=9/65) films of up to ~ 1.23 μm have been developed on LaAlO3 single crystal substrate by magnetron sputtering. The as-grown PLZT thin films exhibit high optical transparency in visible and near-infrared light wavelength and high quadratic (Kerr) EO coefficients. Prism coupler measurements reveal that the PLZT thin films possess large refractive index, as high as 2.524 in TE model and 2.481 in TM model. The transparency of >70% in the range of λ= 500-1200 nm, the optic band gap of 3.42 eV and the quadratic electro-optic (EO) coefficient of 3.38 x 10-17 (m/V)2 have been measured in the films. Due to the large EO coefficient and the micrometric thickness, the as-developed PLZT films have great potential in developing longitudinal-or transverse-type EO devices in electric and optic field. 2013-08-22T04:23:51Z 2019-12-06T19:44:55Z 2013-08-22T04:23:51Z 2019-12-06T19:44:55Z 2012 2012 Journal Article Zhu, M. M., Du, Z. H.,& Ma, J. (2012). Electro-Optic Properties of (100)-Oriented (Pb,La(Zr,Ti)O<sub>3 </sub>Thin Film. Solid State Phenomena, 60-64. https://hdl.handle.net/10356/97648 http://hdl.handle.net/10220/13179 10.4028/www.scientific.net/SSP.185.60 en Solid state phenomena |
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(100)-oriented PLZT ((Pb1-x, Lax) (Zry,Ti1-y)1-x/4O3, x/y=9/65) films of up to ~ 1.23 μm have been developed on LaAlO3 single crystal substrate by magnetron sputtering. The as-grown PLZT thin films exhibit high optical transparency in visible and near-infrared light wavelength and high quadratic (Kerr) EO coefficients. Prism coupler measurements reveal that the PLZT thin films possess large refractive index, as high as 2.524 in TE model and 2.481 in TM model. The transparency of >70% in the range of λ= 500-1200 nm, the optic band gap of 3.42 eV and the quadratic electro-optic (EO) coefficient of 3.38 x 10-17 (m/V)2 have been measured in the films. Due to the large EO coefficient and the micrometric thickness, the as-developed PLZT films have great potential in developing longitudinal-or transverse-type EO devices in electric and optic field. |
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School of Materials Science & Engineering |
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School of Materials Science & Engineering Zhu, Min Min Du, Ze Hui Ma, Jan |
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Zhu, Min Min Du, Ze Hui Ma, Jan |
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Zhu, Min Min Du, Ze Hui Ma, Jan Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film |
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Zhu, Min Min |
title |
Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film |
title_short |
Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film |
title_full |
Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film |
title_fullStr |
Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film |
title_full_unstemmed |
Electro-optic properties of (100)-oriented (Pb,La(Zr,Ti)O3 thin film |
title_sort |
electro-optic properties of (100)-oriented (pb,la(zr,ti)o3 thin film |
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2013 |
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https://hdl.handle.net/10356/97648 http://hdl.handle.net/10220/13179 |
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