APA引文

Asenov, A., Schlichtmann, U., Tan, C. M., Wong, H., Zhou, X., & Engineering, S. o. E. a. E. (2013). ICMAT 2011: Reliability and variability of semiconductor devices and ICs.

Chicago Style Citation

Asenov, Asen, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou, and School of Electrical and Electronic Engineering. ICMAT 2011: Reliability and Variability of Semiconductor Devices and ICs. 2013.

MLA引文

Asenov, Asen, et al. ICMAT 2011: Reliability and Variability of Semiconductor Devices and ICs. 2013.