Thermal characterization and modelling of a gallium arsenide power amplifier MMIC
Thermal characterization of high power microwave devices is important for determining their reliability. Exceeding the optimal temperature will have a detrimental effect on the performance and reliability of these devices. However, temperature characterization of submicron features is often challeng...
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Main Authors: | , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/98407 http://hdl.handle.net/10220/17064 |
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Institution: | Nanyang Technological University |
Language: | English |