Thermal characterization and modelling of a gallium arsenide power amplifier MMIC

Thermal characterization of high power microwave devices is important for determining their reliability. Exceeding the optimal temperature will have a detrimental effect on the performance and reliability of these devices. However, temperature characterization of submicron features is often challeng...

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Bibliographic Details
Main Authors: Ling, Joyce H. L., Tay, Andrew A. O., Choo, Kok Fah, Chen, Weiguo
Other Authors: IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (13th : 2012 : San Diego, USA)
Format: Conference or Workshop Item
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/98407
http://hdl.handle.net/10220/17064
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Institution: Nanyang Technological University
Language: English