Measurement of output driver impedance for signal integrity design consideration
Impedance matching is crucial in high-speed digital design to ensure signal integrity (SI). Accurate information of a...
Saved in:
Main Authors: | , , , , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2010
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/98491 http://hdl.handle.net/10220/6391 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-98491 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-984912020-03-07T13:24:48Z Measurement of output driver impedance for signal integrity design consideration Chang, Richard Weng Yew See, Kye Yak Soh, Wei-Shan Oswal, Manish Wang, Lin Biao School of Electrical and Electronic Engineering Asia Pacific Microwave Conference (2009 : Singapore) Guided Systems Division, DSO National Laboratories DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing Impedance matching is crucial in high-speed digital design to ensure signal integrity (SI). Accurate information of a device’s output impedance allows precise selection of series resistor to match the device’s output to the characteristic impedance of the connecting trace. This paper proposes an incircuit measurement technique using two current probes to extract the output impedance information of an active device under its normal operating conditions. The measured impedance has been validated with the time-domain simulation results obtained from CST Design Studio. Published version 2010-09-02T06:43:36Z 2019-12-06T19:55:59Z 2010-09-02T06:43:36Z 2019-12-06T19:55:59Z 2009 2009 Conference Paper Chang, R. W. Y., See, K. Y., Soh, W. S., Oswal, M., & Wang, L. B. (2009). Measurement of output driver impedance for signal integrity design consideration. In proceedings of the Asia Pacific Microwave Conference: Singapore, (pp.665-668). https://hdl.handle.net/10356/98491 http://hdl.handle.net/10220/6391 10.1109/APMC.2009.5384220 en © 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. 4 p. application/pdf |
institution |
Nanyang Technological University |
building |
NTU Library |
country |
Singapore |
collection |
DR-NTU |
language |
English |
topic |
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing |
spellingShingle |
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing Chang, Richard Weng Yew See, Kye Yak Soh, Wei-Shan Oswal, Manish Wang, Lin Biao Measurement of output driver impedance for signal integrity design consideration |
description |
Impedance matching is crucial in high-speed digital
design to ensure signal integrity (SI). Accurate information of a
device’s output impedance allows precise selection of series
resistor to match the device’s output to the characteristic
impedance of the connecting trace. This paper proposes an incircuit
measurement technique using two current probes to extract
the output impedance information of an active device under its
normal operating conditions. The measured impedance has been
validated with the time-domain simulation results obtained from
CST Design Studio. |
author2 |
School of Electrical and Electronic Engineering |
author_facet |
School of Electrical and Electronic Engineering Chang, Richard Weng Yew See, Kye Yak Soh, Wei-Shan Oswal, Manish Wang, Lin Biao |
format |
Conference or Workshop Item |
author |
Chang, Richard Weng Yew See, Kye Yak Soh, Wei-Shan Oswal, Manish Wang, Lin Biao |
author_sort |
Chang, Richard Weng Yew |
title |
Measurement of output driver impedance for signal integrity design consideration |
title_short |
Measurement of output driver impedance for signal integrity design consideration |
title_full |
Measurement of output driver impedance for signal integrity design consideration |
title_fullStr |
Measurement of output driver impedance for signal integrity design consideration |
title_full_unstemmed |
Measurement of output driver impedance for signal integrity design consideration |
title_sort |
measurement of output driver impedance for signal integrity design consideration |
publishDate |
2010 |
url |
https://hdl.handle.net/10356/98491 http://hdl.handle.net/10220/6391 |
_version_ |
1681046235218182144 |