A mechanical assessment of flexible optoelectronic devices

This work has demonstrated novel experimental methods and their relevant analysis to evaluate the fracture properties of thin brittle films on compliant substrates for flexible optoelectronic devices. Based on the understanding of the failure mechanisms, mechanical calculation has been provided to e...

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Main Authors: Chen, Zhong, Cotterell, Brian, Wang, Wei, Guenther, Ewald, Chua, Soo Jin
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/98738
http://hdl.handle.net/10220/8159
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-987382023-07-14T15:44:55Z A mechanical assessment of flexible optoelectronic devices Chen, Zhong Cotterell, Brian Wang, Wei Guenther, Ewald Chua, Soo Jin School of Materials Science & Engineering DRNTU::Engineering::Materials This work has demonstrated novel experimental methods and their relevant analysis to evaluate the fracture properties of thin brittle films on compliant substrates for flexible optoelectronic devices. Based on the understanding of the failure mechanisms, mechanical calculation has been provided to estimate the thin film fracture toughness and film delamination toughness. These values serve as design parameters on the device flexibility and reliability. Accepted version 2012-05-28T09:05:28Z 2019-12-06T19:59:04Z 2012-05-28T09:05:28Z 2019-12-06T19:59:04Z 2001 2001 Journal Article Chen, Z., Cotterell, B., Wang, W., Guenther, E., & Chua, S. J. (2001). A mechanical assessment of flexible optoelectronic devices. Thin solid films, 394(1-2), 201-205. https://hdl.handle.net/10356/98738 http://hdl.handle.net/10220/8159 10.1016/S0040-6090(01)01138-5 en Thin solid films © 2001 Elsevier Science B.V. This is the author created version of a work that has been peer reviewed and accepted for publication by Thin Solid Films, Elsevier Science B.V. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: DOI: [http://dx.doi.org/10.1016/S0040-6090(01)01138-5]. 18 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
spellingShingle DRNTU::Engineering::Materials
Chen, Zhong
Cotterell, Brian
Wang, Wei
Guenther, Ewald
Chua, Soo Jin
A mechanical assessment of flexible optoelectronic devices
description This work has demonstrated novel experimental methods and their relevant analysis to evaluate the fracture properties of thin brittle films on compliant substrates for flexible optoelectronic devices. Based on the understanding of the failure mechanisms, mechanical calculation has been provided to estimate the thin film fracture toughness and film delamination toughness. These values serve as design parameters on the device flexibility and reliability.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Chen, Zhong
Cotterell, Brian
Wang, Wei
Guenther, Ewald
Chua, Soo Jin
format Article
author Chen, Zhong
Cotterell, Brian
Wang, Wei
Guenther, Ewald
Chua, Soo Jin
author_sort Chen, Zhong
title A mechanical assessment of flexible optoelectronic devices
title_short A mechanical assessment of flexible optoelectronic devices
title_full A mechanical assessment of flexible optoelectronic devices
title_fullStr A mechanical assessment of flexible optoelectronic devices
title_full_unstemmed A mechanical assessment of flexible optoelectronic devices
title_sort mechanical assessment of flexible optoelectronic devices
publishDate 2012
url https://hdl.handle.net/10356/98738
http://hdl.handle.net/10220/8159
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