Optical and electro-optic anisotropy of epitaxial PZT thin films

Strong optical and electro-optic (EO) anisotropy has been investigated in ferroelectric Pb(Zr0.48Ti0.52)O3 thin films epitaxially grown on Nb-SrTiO3 (001), (011), and (111) substrates using magnetron sputtering. The refractive index, electro-optic, and ferroelectric properties of the samples demonst...

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Bibliographic Details
Main Authors: Tok, Alfred Iing Yoong, Teo, Edwin Hang Tong, Zhu, Minmin, Du, Zehui, Jing, Lin
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2015
Online Access:https://hdl.handle.net/10356/99986
http://hdl.handle.net/10220/38673
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Institution: Nanyang Technological University
Language: English
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Summary:Strong optical and electro-optic (EO) anisotropy has been investigated in ferroelectric Pb(Zr0.48Ti0.52)O3 thin films epitaxially grown on Nb-SrTiO3 (001), (011), and (111) substrates using magnetron sputtering. The refractive index, electro-optic, and ferroelectric properties of the samples demonstrate the significant dependence on the growth orientation. The linear electro-optic coefficients of the (001), (011), and (111)-oriented PZT thin films were 270.8, 198.8, and 125.7 pm/V, respectively. Such remarkable anisotropic EO behaviors have been explained according to the structure correlation between the orientation dependent distribution, spontaneous polarization, epitaxial strain, and domain pattern.