Goodness-of-fit tests for correlated paired binary data

10.1177/0962280210381176

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Bibliographic Details
Main Authors: Tang, M.-L., Pei, Y.-B., Wong, W.-K., Li, J.-L.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105164
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Institution: National University of Singapore