Progressively censored reliability sampling plans for the Weibull distribution

Technometrics

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Bibliographic Details
Main Authors: Balasooriya, U., Saw, S.L.C., Gadag, V.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105313
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Institution: National University of Singapore
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