Sequential estimation in line transect surveys

Biometrics

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Bibliographic Details
Main Authors: XiChen, S., Yip, P.S.F., Zhou, Y.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105357
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Institution: National University of Singapore