Ferroelectric and dielectric properties of 0.6SrBi 2Nb 2O 9-0.4BiFeO 3 thin films
10.1016/j.tsf.2004.01.079
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Main Authors: | Xue, J.M., Sim, M.H., Ezhilvalavan, S., Zhou, Z.H., Wang, J., Zhu, H., Miao, J.M. |
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Other Authors: | MATERIALS SCIENCE |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/107038 |
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Institution: | National University of Singapore |
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