Ferroelectric and dielectric properties of 0.6SrBi 2Nb 2O 9-0.4BiFeO 3 thin films

10.1016/j.tsf.2004.01.079

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Bibliographic Details
Main Authors: Xue, J.M., Sim, M.H., Ezhilvalavan, S., Zhou, Z.H., Wang, J., Zhu, H., Miao, J.M.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107038
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Institution: National University of Singapore

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