Effect of Cu contamination on electrical characteristics for PMOS transistors
International Symposium on IC Technology, Systems and Applications
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sg-nus-scholar.10635-1072662015-01-30T22:00:08Z Effect of Cu contamination on electrical characteristics for PMOS transistors Tee, K.C. Prasad, K. Lee, C.S. Gong, H. Chan, L. See, A.K. MATERIALS SCIENCE International Symposium on IC Technology, Systems and Applications 8 251-253 2014-10-29T08:41:54Z 2014-10-29T08:41:54Z 1999 Conference Paper Tee, K.C.,Prasad, K.,Lee, C.S.,Gong, H.,Chan, L.,See, A.K. (1999). Effect of Cu contamination on electrical characteristics for PMOS transistors. International Symposium on IC Technology, Systems and Applications 8 : 251-253. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/107266 NOT_IN_WOS Scopus |
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International Symposium on IC Technology, Systems and Applications |
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MATERIALS SCIENCE Tee, K.C. Prasad, K. Lee, C.S. Gong, H. Chan, L. See, A.K. |
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Conference or Workshop Item |
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Tee, K.C. Prasad, K. Lee, C.S. Gong, H. Chan, L. See, A.K. |
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Tee, K.C. Prasad, K. Lee, C.S. Gong, H. Chan, L. See, A.K. Effect of Cu contamination on electrical characteristics for PMOS transistors |
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Tee, K.C. |
title |
Effect of Cu contamination on electrical characteristics for PMOS transistors |
title_short |
Effect of Cu contamination on electrical characteristics for PMOS transistors |
title_full |
Effect of Cu contamination on electrical characteristics for PMOS transistors |
title_fullStr |
Effect of Cu contamination on electrical characteristics for PMOS transistors |
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Effect of Cu contamination on electrical characteristics for PMOS transistors |
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effect of cu contamination on electrical characteristics for pmos transistors |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/107266 |
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