Effect of Cu contamination on electrical characteristics for PMOS transistors

International Symposium on IC Technology, Systems and Applications

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Bibliographic Details
Main Authors: Tee, K.C., Prasad, K., Lee, C.S., Gong, H., Chan, L., See, A.K.
Other Authors: MATERIALS SCIENCE
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107266
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1072662015-01-30T22:00:08Z Effect of Cu contamination on electrical characteristics for PMOS transistors Tee, K.C. Prasad, K. Lee, C.S. Gong, H. Chan, L. See, A.K. MATERIALS SCIENCE International Symposium on IC Technology, Systems and Applications 8 251-253 2014-10-29T08:41:54Z 2014-10-29T08:41:54Z 1999 Conference Paper Tee, K.C.,Prasad, K.,Lee, C.S.,Gong, H.,Chan, L.,See, A.K. (1999). Effect of Cu contamination on electrical characteristics for PMOS transistors. International Symposium on IC Technology, Systems and Applications 8 : 251-253. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/107266 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description International Symposium on IC Technology, Systems and Applications
author2 MATERIALS SCIENCE
author_facet MATERIALS SCIENCE
Tee, K.C.
Prasad, K.
Lee, C.S.
Gong, H.
Chan, L.
See, A.K.
format Conference or Workshop Item
author Tee, K.C.
Prasad, K.
Lee, C.S.
Gong, H.
Chan, L.
See, A.K.
spellingShingle Tee, K.C.
Prasad, K.
Lee, C.S.
Gong, H.
Chan, L.
See, A.K.
Effect of Cu contamination on electrical characteristics for PMOS transistors
author_sort Tee, K.C.
title Effect of Cu contamination on electrical characteristics for PMOS transistors
title_short Effect of Cu contamination on electrical characteristics for PMOS transistors
title_full Effect of Cu contamination on electrical characteristics for PMOS transistors
title_fullStr Effect of Cu contamination on electrical characteristics for PMOS transistors
title_full_unstemmed Effect of Cu contamination on electrical characteristics for PMOS transistors
title_sort effect of cu contamination on electrical characteristics for pmos transistors
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/107266
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