Ferroelectric properties and leakage current mechanisms in SrBi 2(V0.1Nb0.9)2O9 (SBVN) thin films

Ferroelectric properties and leakage current mechanisms in SrBi 2(V0.1Nb0.9)2O9 (SBVN) thin films

10.1016/j.ceramint.2003.12.128

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Bibliographic Details
Main Authors: Ezhilvalavan, S., Samper, V., Seng, T.W., Junmin, X., Wang, J.
Other Authors: MATERIALS SCIENCE
Format: Conference or Workshop Item
Published: 2014
Subjects:
A. Films
C. Electrical conductivity
C. Ferroelectric properties
D. Perovskites
E. Functional applications
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107274
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/107274

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