Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

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Main Authors:	Sun, C.J., Chow, G.M., Wang, J.P., Soo, E.W., Je, J.H.
Other Authors:	MATERIALS SCIENCE
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/107309
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1073092015-02-18T21:36:07Z Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity Sun, C.J. Chow, G.M. Wang, J.P. Soo, E.W. Je, J.H. MATERIALS SCIENCE Digests of the Intermag Conference GS01- DICOD 2014-10-29T08:42:28Z 2014-10-29T08:42:28Z 2002 Conference Paper Sun, C.J.,Chow, G.M.,Wang, J.P.,Soo, E.W.,Je, J.H. (2002). Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity. Digests of the Intermag Conference : GS01-. ScholarBank@NUS Repository. 00746843 http://scholarbank.nus.edu.sg/handle/10635/107309 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Digests of the Intermag Conference
author2	MATERIALS SCIENCE
author_facet	MATERIALS SCIENCE Sun, C.J. Chow, G.M. Wang, J.P. Soo, E.W. Je, J.H.
format	Conference or Workshop Item
author	Sun, C.J. Chow, G.M. Wang, J.P. Soo, E.W. Je, J.H.
spellingShingle	Sun, C.J. Chow, G.M. Wang, J.P. Soo, E.W. Je, J.H. Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
author_sort	Sun, C.J.
title	Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
title_short	Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
title_full	Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
title_fullStr	Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
title_full_unstemmed	Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity
title_sort	study of the crystallographic texture and interface roughness on cocrpt/ti magnetic thin film using x-ray scattering and x-ray reflectivity
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/107309
_version_	1681093621784248320

Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

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