Error correction for diffraction and multiple scattering in free-space microwave measurement of materials
10.1109/TMTT.2005.862666
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Main Author: | Hock, K.M. |
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Other Authors: | TEMASEK LABORATORIES |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/111394 |
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Institution: | National University of Singapore |
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