A comparison of post-processing techniques for biased random number generators

• Main Authors: Kwok, S.-H., Ee, Y.-L., Chew, G., Zheng, K., Khoo, K., Tan, C.-H.
• Other Authors: TEMASEK LABORATORIES
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: bias; entropy; linear correcting codes; post-processing; random number generators
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/111511
• Institution: National University of Singapore

10.1007/978-3-642-21040-2_12