Xie, X., Chung, H., Sow, C., Wee, A., & PHYSICS. (2014). Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam.

Xie, X.N., H.J Chung, C.H Sow, A.T.S Wee, و PHYSICS. Chemical and Dielectrical Characteristics of Ultrathin Oxides Grown By Atomic Force Microscopy and Scanning Electron Beam. 2014.

Xie, X.N., et al. Chemical and Dielectrical Characteristics of Ultrathin Oxides Grown By Atomic Force Microscopy and Scanning Electron Beam. 2014.