APA引文

Xie, X., Chung, H., Sow, C., Wee, A., & PHYSICS. (2014). Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam.

Chicago Style Citation

Xie, X.N., H.J Chung, C.H Sow, A.T.S Wee, and PHYSICS. Chemical and Dielectrical Characteristics of Ultrathin Oxides Grown By Atomic Force Microscopy and Scanning Electron Beam. 2014.

MLA引文

Xie, X.N., et al. Chemical and Dielectrical Characteristics of Ultrathin Oxides Grown By Atomic Force Microscopy and Scanning Electron Beam. 2014.