Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination
Optical Engineering
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sg-nus-scholar.10635-1127282024-11-09T03:12:00Z Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination Zhang, J. DATA STORAGE INSTITUTE Electronic speckle pattern interferometry (ESPI) Hole-drilling technique In-plane displacement Residual stress/strain Optical Engineering 37 8 2402-2409 OPEGA 2014-11-28T06:50:11Z 2014-11-28T06:50:11Z 1998-08 Article Zhang, J. (1998-08). Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination. Optical Engineering 37 (8) : 2402-2409. ScholarBank@NUS Repository. 00913286 http://scholarbank.nus.edu.sg/handle/10635/112728 NOT_IN_WOS Scopus |
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Electronic speckle pattern interferometry (ESPI) Hole-drilling technique In-plane displacement Residual stress/strain |
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Electronic speckle pattern interferometry (ESPI) Hole-drilling technique In-plane displacement Residual stress/strain Zhang, J. Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
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Optical Engineering |
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DATA STORAGE INSTITUTE |
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DATA STORAGE INSTITUTE Zhang, J. |
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Article |
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Zhang, J. |
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Zhang, J. |
title |
Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
title_short |
Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
title_full |
Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
title_fullStr |
Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
title_full_unstemmed |
Two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
title_sort |
two-dimensional in-plane electronic speckle pattern interferometer and its application to residual stress determination |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/112728 |
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