Energy-dependent systematic errors in dual-energy X-ray CT

10.1109/23.568808

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Bibliographic Details
Main Authors: Goh, K.L., Liew, S.C., Hasegawa, B.H.
Other Authors: CTR FOR REM IMAGING,SENSING & PROCESSING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/112832
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Institution: National University of Singapore