Pey, K., Tung, C., Tang, L., Ranjan, R., Radhakrishnan, M., Lin, W., . . . MICROELECTRONICS, I. O. (2014). Structural analysis of breakdown in ultrathin gate dielectrics using transmission electron microscopy.

Pey, K.L., C.H Tung, L.J Tang, R. Ranjan, M.K Radhakrishnan, W.H Lin, S. Lombardo, F. Palumbo, و INSTITUTE OF MICROELECTRONICS. Structural Analysis of Breakdown in Ultrathin Gate Dielectrics Using Transmission Electron Microscopy. 2014.

Pey, K.L., et al. Structural Analysis of Breakdown in Ultrathin Gate Dielectrics Using Transmission Electron Microscopy. 2014.