Pey, K., Tung, C., Tang, L., Ranjan, R., Radhakrishnan, M., Lin, W., . . . MICROELECTRONICS, I. O. (2014). Structural analysis of breakdown in ultrathin gate dielectrics using transmission electron microscopy.
Chicago Style CitationPey, K.L., C.H Tung, L.J Tang, R. Ranjan, M.K Radhakrishnan, W.H Lin, S. Lombardo, F. Palumbo, and INSTITUTE OF MICROELECTRONICS. Structural Analysis of Breakdown in Ultrathin Gate Dielectrics Using Transmission Electron Microscopy. 2014.
MLA CitationPey, K.L., et al. Structural Analysis of Breakdown in Ultrathin Gate Dielectrics Using Transmission Electron Microscopy. 2014.
Warning: These citations may not always be 100% accurate.