APA引文

Pey, K., Tung, C., Tang, L., Ranjan, R., Radhakrishnan, M., Lin, W., . . . MICROELECTRONICS, I. O. (2014). Structural analysis of breakdown in ultrathin gate dielectrics using transmission electron microscopy.

Chicago Style Citation

Pey, K.L., C.H Tung, L.J Tang, R. Ranjan, M.K Radhakrishnan, W.H Lin, S. Lombardo, F. Palumbo, and INSTITUTE OF MICROELECTRONICS. Structural Analysis of Breakdown in Ultrathin Gate Dielectrics Using Transmission Electron Microscopy. 2014.

MLA引文

Pey, K.L., et al. Structural Analysis of Breakdown in Ultrathin Gate Dielectrics Using Transmission Electron Microscopy. 2014.