APA引文

Lau, G., Tok, E., Liu, R., Wee, A., Zhang, J., & SCIENCE, I. O. E. (2014). Roughening behavior in Si/SiGe heterostructures under O2 + bombardment.

Chicago Style Citation

Lau, G.S., E.S Tok, R. Liu, A.T.S Wee, J. Zhang, and INSTITUTE OF ENGINEERING SCIENCE. Roughening Behavior in Si/SiGe Heterostructures Under O2 + Bombardment. 2014.

MLA引文

Lau, G.S., et al. Roughening Behavior in Si/SiGe Heterostructures Under O2 + Bombardment. 2014.