The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profiling
10.1016/S0218-625X(01)00123-3
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| Main Authors: | , , , , |
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| 格式: | Article |
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2014
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| 在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/113107 |
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