A graphical approach to obtaining confidence limits of C pk

• Main Authors: Tang, L.C., Than, S.E., Ang, B.W.
• Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Process capability analysis: C pkConfidence interval; Six sigma
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/114483
• Institution: National University of Singapore

Quality and Reliability Engineering International