Text this: A new breakdown failure mechanism in HfO 2 gate dielectric

            ______    _____     _____    _    _   
  ____     /_   _//  |__  //   |  ___|| | |  | || 
 |    \\    -| ||-     / //    | ||__   | |/\| || 
 | [] ||    _| ||_    / //__   | ||__   |  /\  || 
 |  __//   /_____//  /_____||  |_____|| |_// \_|| 
 |_|`-`    `-----`   `-----`   `-----`  `-`   `-` 
 `-`