Topological electronic states in Sb and Bi films by STS measurements and DFT calculations

• Main Author: LUO ZIYU
• Other Authors: PHYSICS
• Format: Theses and Dissertations
• Language: English
• Published: 2015
• Subjects: Topological Insulators, STS, DFT, QPI Pattern, Penetration Depth, Sb and Bi Thin Films
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/119260
• Institution: National University of Singapore

Ph.D