Topological changes of the effective connectivity during the working memory training

10.1109/EMBC.2014.6945055

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Bibliographic Details
Main Authors: Sun, Yu, Taya, Fumihiko, Chen, Yu, Delgado-Martinez, Ignacio, Thakor, Nitish Vyomesh, Bezerianos, Anastasios
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: Institute of Electrical and Electronics Engineers 2015
Online Access:http://scholarbank.nus.edu.sg/handle/10635/120480
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Institution: National University of Singapore
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